Micromanipulator Releases the world’s first true system-level Flip Chip & Double Sided probe system with above and below ambient temperature capabilities.
The patented Micromanipulator VERSA Double Sided Probe station can probe from both above and below the test device and has been specifically designed to change into the probe system you need for wafer-level probe capability all the way to board level testing, making post-tape-out product testing easier than ever.
Please see Product page for further details >> VERSA Double Sided Probe Station