EMMI / Thermal Testing.

Failure analysis equipment for investigating faults, defects and damage to semiconductors using scientific grade systems for Photon Emission detection, Thermal hot spot detection, and Laser scanning.

1. Photon Emmission Microscope – Front and Back side

2. Infrared Thermal Microscope 

3. Fluorescent Microthermal Imaging Microscope (FMI)

Please see below for features, specifications and images

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