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2210-LS Application Board Probe Station

2210-LS Application Board Probe Station is a patented system level probe station that has been specifically designed to migrate wafer level probe capability to test board level to assist with post tape-out product testing.

“The 2210-LS Application Board Probe Station is the world’s first true system level probe station with above and below ambient temperature capabilities. It enables the user to probe decapsulated ICs mounted onto test boards at above and below ambient temperatures without limiting the board’s ability to exercise the chip functionality and without limiting the probing capability employed at the wafer level, allowing the user to trace and analyze issues that manifest only in the actual end application environment”.

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The 2210-LS can probe:

  • Application boards measuring up to 24″ square in ambient mode, and up to 18″ in temperature mode.
  • Wafers up to 300mm.
  • Wafer pieces and oddly shaped/sized test samples.
  • Temperature range supported: -40C to 125C, or ambient.

2210LS configurations and options available;

Features and Specifications subject to change without notice

System <200mm, 200mm, 300mm, System Level/Packaged Part
System Capability Hot/Cold, Microprobing
System Control Manual
Dimensions 30” x 36” optical vibration isolation table accommodates
application boards measuring approximately 26” square.
Microscope Standard single objective A-zoom microscope for high magnification viewing and un-obstructed probe access to sample.
Options Removable ambient and thermal chucks for wafer level probing needs.
Stereo zoom and compound microscopes.
CCD and video monitor options.

Features and Specifications subject to change without notice

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