2210-LS Application Board Probe Station

2210-LS Application Board Probe Station is a patented system level probe station that has been specifically designed to migrate wafer level probe capability to test board level to assist with post tape-out product testing.

“The 2210-LS Application Board Probe Station is the world’s first true system level probe station with above and below ambient temperature capabilities. It enables the user to probe decapsulated ICs mounted onto test boards at above and below ambient temperatures without limiting the board’s ability to exercise the chip functionality and without limiting the probing capability employed at the wafer level, allowing the user to trace and analyze issues that manifest only in the actual end application environment”.