Mercia Semiconductor is pleased to announce our new partner Lig Nanowise!

Mercia Semiconductor is excited to add Lig Nanowise Microscopes, Nano-Scopes and Objectives to our portfolio. Optical instruments powered by world leading microsphere technology to solve problems in industry and academia and empower researchers and businesses. Advanced optics that provide new ways of seeing the world to build better technologies, devices, and products.

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Mercia Semiconductor is pleased to announce the Pelco Range of Scribe, Indent & Cleaving products from our new partner Ted Pella Incorporated!

Following the acquisition of LatticeGear by Ted Pella Incorporated, Mercia Semiconductor is happy to announce the continued representation of the Pelco range of products for sample preparation to Scribe, Indent, and Cleave wafers and similar samples for the Semiconductor, Photonics’, and Materials Science industries.

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WJA electron provides services for electron beam and focused ion beam equipment, as well as specialist services for electron sources.

Further details coming soon!

 

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The patented Micromanipulator VERSA Double Sided Probe station can probe from both above and below the test device and has been specifically designed to change into the probe system you need for wafer-level probe capability all the way to board level testing, making post-tape-out product testing easier than ever.

Please see Product page for further details >> VERSA Double Sided Probe Station

AutolazeQL laser based micro-machining system.

Available with 532nm and 355nm (switchable), with various magnification objective lenses to deliver an on axis minimum spot size of two microns

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Mechanical Decapsulation and Sample Preparation Systems.

OmegaPrep & NEW UltraPrep III.

Designed to perform in-package die thinning and polishing, along with special machining functions for sample preparation.

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