VERSA Modular Probe System

VERSA Modular Probe System is a patented wafer level to system level probe system with above and below ambient temperature capabilities.

“The patented micromanipulator VERSA Modular Probe System has been specifically designed to change into the probe system you need at that moment with wafer-level probe capability all the way to board level testing, making post-tape-out product testing easier than ever.”

VERSA Modular Probe System offers:

  • An integrated vibration isolation platform
  • Test wafers, boards, pieces, packaged parts, and individual die, all at temperature
  • A modular design, allowing for all device testing, such as back-side and double-sided
  • Customized thermal options – hot and cold (frost-free)
  • High-power, DC (direct current), high frequency, and mmW
  • High-speed signal acquisition
  • The ability to be used as an optical inspection platform
  • Space to setup several devices simultaneously
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