VERSA Modular Probe System
VERSA Modular Probe System is a patented wafer level to system level probe system with above and below ambient temperature capabilities.
“The patented micromanipulator VERSA Modular Probe System has been specifically designed to change into the probe system you need at that moment with wafer-level probe capability all the way to board level testing, making post-tape-out product testing easier than ever.”
VERSA Modular Probe System offers:
- An integrated vibration isolation platform
- Test wafers, boards, pieces, packaged parts, and individual die, all at temperature
- A modular design, allowing for all device testing, such as back-side and double-sided
- Customized thermal options – hot and cold (frost-free)
- High-power, DC (direct current), high frequency, and mmW
- High-speed signal acquisition
- The ability to be used as an optical inspection platform
- Space to setup several devices simultaneously
The patented wafer level to system level probe system with above and below ambient temperature capabilities.
VERSA, you can probe:
- Any device up to 24″ square in ambient mode, and; up to 18″ square in temperature mode.
- Wafers up to 300mm.
- Wafer pieces and oddly shaped/sized test samples.
- Custom.
VERSA configurations and options available;
- Integrated vibration isolation base platform.
- Two independent, moveable platens.
- Large translation manual microscope motion with precise fine motion.
- Microscope system of your choice (Stereo or Compound).
- Choice of Manipulators (up to 10).
- Large choice of Probe holders and tips including passive, active, RF, and many more.
- Upgradeable temperature option. (-40C to 125C).
Features and Specifications subject to change without notice
System | <200mm, 200mm, 300mm, System Level/Packaged Part |
System Capability | Hot/Cold, Microprobing |
System Control | Manual |
System Value Considerations | Custom Configured Systems, Research |
Dimensions | Assembled Dimensions: 46” wide X 44” L X 50” H Assembled Weight: 350lbs |
Microscope & Optics | Microscope gantry allows you to move across the entire 26” x 26” testing area. Supports all optical microscopes. Add a second tool with the large gantry for even more testing options. |
Stage Area | Ambient 26” x 26” testing area. 200mm – 300mm chuck standard. 10”x10” – 18’x18” thermal chamber standard. Enough space to set up several devices simultaneously. VERSA allows us to make the right staging area for you. |
Customizing Options | Thermal Chambers, Thermal Chucks, Laser Ready, Electro-magnet capable, VERSA ambient with 300mm wafer, VERSA ambient with board holder, VERSA with 18”x18” thermal chamber, Fine positioning stages, Double side probing/viewing, RF & DC Positioners, Wafer chuck & board holders |
Features and Specifications subject to change without notice